利索-全球专利检索

  1. 登录
  2. 注册

搜索结果

19 条记录 (耗时 0.014 秒)

    Controlled delivery of a charging current to a boost capacitor of a voltage regulator
    1.
    发明授权
    Controlled delivery of a charging current to a boost capacitor of a voltage regulator 有权
    将控制的充电电流传送到电压调节器的升压电容器

    公开(公告)号：US09397571B2

    公开(公告)日：2016-07-19

    申请号：US13166677

    申请日：2011-06-22

    申请人： Joel Tang ,  Qingxiang Zhang ,  Seth Kahn ,  David Lidsky

    发明人： Joel Tang ,  Qingxiang Zhang ,  Seth Kahn ,  David Lidsky

    IPC分类号： H02M3/158 ,  H02M3/156 ,  H02M1/00

    CPC分类号： H02M3/1588 ,  H02M3/1563 ,  H02M2001/0003 ,  Y02B70/1466

    摘要： Disclosed are devices, apparatus, circuitry, components, mechanisms, modules, units, systems, and processes for controlling a power switch of a voltage regulator. A capacitor is coupled to an output of the power switch. Charge delivery circuitry is coupled to the capacitor and configured to provide a charging current to the capacitor. Charge control circuitry can be coupled to the charge delivery circuitry and configured to selectively allow the providing of the charging current to the capacitor.

    摘要翻译： 公开了用于控制电压调节器的电源开关的装置，装置，电路，组件，机构，模块，单元，系统和过程。 电容器耦合到电源开关的输出端。 电荷输送电路耦合到电容器并且被配置为向电容器提供充电电流。 充电控制电路可以耦合到电荷传输电路并且被配置为选择性地允许向电容器提供充电电流。

    Integrated electrical circuit and test to determine the integrity of a silicon die
    4.
    发明授权
    Integrated electrical circuit and test to determine the integrity of a silicon die 有权
    集成电路和测试以确定硅片的完整性

    公开(公告)号：US08253420B2

    公开(公告)日：2012-08-28

    申请号：US12631221

    申请日：2009-12-04

    申请人： Charles Nickel ,  Katherine Nickel, legal representative ,  David Lidsky ,  Seth Kahn

    发明人： Charles Nickel ,  David Lidsky ,  Seth Kahn

    IPC分类号： G01R31/08

    CPC分类号： G01R31/2884

    摘要： A detection circuit and one or more wires or circuit traces are included in a die. The combination is used to detect mechanical failure of the substrate, e.g. silicon after singulation of the dice from the wafer. Failures may be detected at different regions or planes within the die, and the tests may be performed during operation of the packaged die and integrated circuit, even after installation and during operation of a larger electronic device in which it is incorporated. This is especially useful for chip scale packages, but may be utilized in any type of IC package.

    摘要翻译： 检测电路和一个或多个导线或电路迹线包括在管芯中。 该组合用于检测衬底的机械故障，例如， 硅晶片从晶片上分离出晶片。 可以在管芯内的不同区域或平面处检测到故障，并且即使在其中并入其中的较大的电子设备的安装和操作之后，也可以在封装的管芯和集成电路的操作期间执行测试。 这对于芯片级封装特别有用，但可用于任何类型的IC封装。

    Method and apparatus for selecting multiple settings for an integrated circuit function
    6.
    发明申请
    Method and apparatus for selecting multiple settings for an integrated circuit function 有权
    用于选择集成电路功能的多个设置的方法和装置

    公开(公告)号：US20050231406A1

    公开(公告)日：2005-10-20

    申请号：US11130614

    申请日：2005-05-16

    申请人： Jeremy Flasck ,  Andrew Burstein ,  David Lidsky ,  Michael McJimsey

    发明人： Jeremy Flasck ,  Andrew Burstein ,  David Lidsky ,  Michael McJimsey

    IPC分类号： H03K19/173 ,  H03M1/00

    CPC分类号： G11C29/028 ,  G11C2029/5004 ,  H03K19/1731

    摘要： A method and apparatus for determining a setting specified from a plurality of the settings for a function provided in an integrated circuit, wherein the setting is specified by connecting an external measurement resistor to a measurement terminal of the integrated circuit, comprises applying a direct current to the measurement terminal of the integrated circuit, thereby producing a measurement voltage at the measurement terminal; applying the direct current to a reference terminal of the integrated circuit, wherein the reference terminal has an external reference resistor connected thereto, thereby producing a reference voltage at the reference terminal; quantizing a voltage level of a difference voltage representing a voltage difference between the reference voltage and the measurement voltage, thereby producing a quantized voltage; and providing control signals to a functional module within the integrated circuit, the control signals representing the one of the settings corresponding to the quantized voltage, wherein each of the settings is represented by a different quantized voltage; wherein the functional module implements the one of the settings represented by the control signals.

    摘要翻译： 一种用于确定从集成电路中提供的功能的多个设置中指定的设置的方法和装置，其中通过将外部测量电阻器连接到集成电路的测量端子来指定该设置，包括将直流电流施加到 集成电路的测量端子，从而在测量端产生测量电压; 将所述直流电流施加到所述集成电路的参考端子，其中所述参考端子具有与其连接的外部参考电阻，从而在所述参考端产生参考电压; 量化表示基准电压与测量电压之间的电压差的差分电压的电压电平，从而产生量化电压; 以及向所述集成电路内的功能模块提供控制信号，所述控制信号表示对应于所述量化电压的所述设置之一，其中每个所述设置由不同的量化电压表示; 其中所述功能模块实现由所述控制信号表示的所述设置之一。

    Redundant path all-optical regeneration, reshaping and wavelength conversion for enhanced yield
    7.
    发明授权
    Redundant path all-optical regeneration, reshaping and wavelength conversion for enhanced yield 有权
    冗余路径全光学再生，重塑和波长转换，提高产量

    公开(公告)号：US07203427B2

    公开(公告)日：2007-04-10

    申请号：US10147333

    申请日：2002-05-15

    申请人： Gaurav Naik ,  Jithamithra Sarathy ,  Michael Evans ,  David Lidsky

    发明人： Gaurav Naik ,  Jithamithra Sarathy ,  Michael Evans ,  David Lidsky

    IPC分类号： H04B10/02

    CPC分类号： H04B10/299 ,  G02F1/3517 ,  G02F2001/217 ,  G02F2002/006

    摘要： A system, method and device for AO2R is presented. The AO2R system presented is redundant, containing multiple pathways for the input and output signals to travel. The system carries out both the regeneration and reshaping functions in the optical domain, and returns a clean output signal at the same bit rate and in the same format as the input signal, on a wavelength of choice. As an all optical device, the apparatus is bit rate and format transparent, and requires no optical-electrical-optical conversion. The system's built in redundancy and symmetry allows less than perfect yields on components to be tolerated, thus increasing the utility of devices manufactured with less than perfect yields. In alternative embodiments the redundancy aspect of the invention can be extended to any optical signal processing device, thus facilitating high availability optical signal processing.

    摘要翻译： 提出了一种用于AO2R的系统，方法和装置。 提出的AO2R系统是冗余的，包含用于输入和输出信号行进的多个路径。 该系统在光域中实现再生和再成形功能，并以与所选择的波长相同的比特率和与输入信号相同的格式返回干净的输出信号。 作为全光学装置，该装置是比特率和格式透明的，不需要光电转换。 该系统内置的冗余和对称性允许组件的耐受性不佳，从而增加了以不太完美的产量制造的设备的效用。 在替代实施例中，本发明的冗余方面可以扩展到任何光信号处理设备，从而便于高可用性光信号处理。

    Azimuth angle measurement
    8.
    发明授权
    Azimuth angle measurement 有权
    方位角测量

    公开(公告)号：US08040511B1

    公开(公告)日：2011-10-18

    申请号：US12357294

    申请日：2009-01-21

    申请人： Shankar Krishnan ,  Haixing Zhou ,  Haiming Wang ,  David Lidsky ,  Walter Dean Mieher

    发明人： Shankar Krishnan ,  Haixing Zhou ,  Haiming Wang ,  David Lidsky ,  Walter Dean Mieher

    IPC分类号： G01J4/00

    CPC分类号： G01N21/211 ,  G01B11/26

    摘要： Methods and apparatus for measuring an optical azimuth angle φO of a substrate relative to a plane of detection in scatterometry tools are disclosed. A grating target on a stage of a scatterometry tool may be illuminated and positions of the resulting diffraction orders may be observed. The optical azimuth angle may be determined from the positions of the diffraction orders. Alternatively, polarization-dependent signals of radiation scattered from a line grating may be measured for equal and opposite polarization angles +A and −A. A combination signal may be computed from the polarization-dependent signals obtained at +A and −A and a property of the combination signal may be calculated for several mechanical Azimuth angles φM. A relationship between the optical azimuth angle φO and the mechanical azimuth angle φM may be determined from a behavior of the property as a function of mechanical azimuth angle φM.

    摘要翻译： 公开了用于测量基底相对于散射测量工具中的检测平面的光学方位角＆lt; O的方法和装置。 可以照射散射测量工具的台上的光栅目标，并且可以观察所得衍射级的位置。 光学方位角可以从衍射级的位置确定。 或者，可以测量从线光栅散射的辐射的偏振相关信号，以获得相等和相反的偏振角+ A和-A。 可以从在+ A和-A处获得的偏振相关信号计算组合信号，并且可以针对若干机械方位角＆amp; M来计算组合信号的特性。 可以根据作为机械方位角的函数的性质的行为来确定光学方位角＆lt; O和机械方位角＆amp; M之间的关系。