Invention Grant
- Patent Title: Test carrier
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Application No.: US14405064Application Date: 2013-05-27
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Publication No.: US09702901B2Publication Date: 2017-07-11
- Inventor: Kiyoto Nakamura , Kazuo Takano , Noriyuki Masuda
- Applicant: ADVANTEST CORPORATION
- Applicant Address: JP Tokyo
- Assignee: ADVANTEST CORPORATION
- Current Assignee: ADVANTEST CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Greenblum & Bernstein, P.L.C.
- Priority: JP2012-128164 20120605
- International Application: PCT/JP2013/064608 WO 20130527
- International Announcement: WO2013/183479 WO 20131212
- Main IPC: G01R31/00
- IPC: G01R31/00 ; G01R1/04 ; G01R31/28

Abstract:
A test carrier includes a base member that holds a die and a cover member. The base member includes a board having a wiring line that is electrically connected to the die. The wiring line includes a wiring line and a resistive portion having a resistance value that is higher than the resistance value of the wiring line.
Public/Granted literature
- US20150130492A1 TEST CARRIER Public/Granted day:2015-05-14
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