- 专利标题： Self testing fault circuit apparatus and method
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申请号： US14030999申请日： 2013-09-18
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公开(公告)号： US09709626B2公开(公告)日： 2017-07-18
- 发明人: Michael Ostrovsky , Adam Kevelos
- 申请人： Leviton Manufacturing Co., Inc.
- 申请人地址： US NY Melville
- 专利权人： Leviton Manufacturing Company, Inc.
- 当前专利权人： Leviton Manufacturing Company, Inc.
- 当前专利权人地址： US NY Melville
- 代理机构： Foley & Lardner LLP
- 主分类号： G01R31/28
- IPC分类号： G01R31/28 ; G01R31/327 ; H02H3/33
摘要：
A process for self testing a fault circuit includes disabling an actuator, performing a self test by creating a simulated fault signal across at least a portion of a half cycle of a first polarity and across at least a portion of a hall cycle of a second polarity, and determining whether the self test was successful.
公开/授权文献
- US20140197856A1 SELF TESTING FAULT CIRCUIT APPARATUS AND METHOD 公开/授权日：2014-07-17
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