Invention Grant
- Patent Title: Drop impact tester and method for drop impact test
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Application No.: US14657197Application Date: 2015-03-13
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Publication No.: US09739697B2Publication Date: 2017-08-22
- Inventor: Jong-Nam Lee , Ikjun Hong , Minsu Kim
- Applicant: Samsung Display Co., Ltd.
- Applicant Address: KP Gyeonggi-do
- Assignee: Samsung Display Co., Ltd.
- Current Assignee: Samsung Display Co., Ltd.
- Current Assignee Address: KP Gyeonggi-do
- Agency: Knobbe Martens Olson & Bear LLP
- Priority: KR10-2014-0106115 20140814
- Main IPC: G01N3/303
- IPC: G01N3/303

Abstract:
A drop impact tester comprises a holder configured to hold a test piece and release the test piece such that the test piece drops in freefall; an impact surface disposed under the holder such that the test piece dropped from the holder hits the impact surface; and a drop angle measurement device configured to measure a drop angle which is a value correlated with an angle between a major surface of the dropped test piece and a reference plane. The tester further comprises an impact measurement device configured to move the impact surface from its first posing state to its second posing state to adjust an angle of the impact surface with respect to the reference plane based on the drop angle. The impact measurement device is configured to measure a drop impact applied to the impact surface by the dropped test piece or another test piece.
Public/Granted literature
- US20160047725A1 DROP IMPACT TESTER AND METHOD FOR DROP IMPACT TEST Public/Granted day:2016-02-18
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