Invention Grant
- Patent Title: Method for programming a three-dimensional workpiece scan path for a metrology system
-
Application No.: US14511100Application Date: 2014-10-09
-
Publication No.: US09740190B2Publication Date: 2017-08-22
- Inventor: Robert Kamil Bryll
- Applicant: Mitutoyo Corporation
- Applicant Address: JP Kanagawa-ken
- Assignee: Mitutoyo Corporation
- Current Assignee: Mitutoyo Corporation
- Current Assignee Address: JP Kanagawa-ken
- Agency: Seed IP Law Group LLP
- Main IPC: G05B19/21
- IPC: G05B19/21

Abstract:
A method for programming a three-dimensional (3D) workpiece scan path for a metrology system comprising a 3D motion control system, a first type of Z-height sensing system, and a second type of Z-height sensing system that provides less precise surface Z-height measurements over a broader Z-height measuring range. The method comprises: placing a representative workpiece on a stage of the metrology system, defining at least a first workpiece scan path segment for the representative workpiece, determining preliminary actual surface Z-height measurements along the first workpiece scan path segment, and determining a precise 3D scan path for moving the first type of Z-height sensing system to perform precise surface Z-height measurements. The precise 3D scan path is based on the determined preliminary actual surface Z-height measurements. The precise 3D scan path may be used for performing precise surface Z-height measurements or stored to be used in an inspection program.
Public/Granted literature
- US20160103443A1 METHOD FOR PROGRAMMING A THREE-DIMENSIONAL WORKPIECE SCAN PATH FOR A METROLOGY SYSTEM Public/Granted day:2016-04-14
Information query
IPC分类: