- 专利标题: Wavelength calibration method for monochromator
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申请号: US14478903申请日: 2014-09-05
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公开(公告)号: US09752934B2公开(公告)日: 2017-09-05
- 发明人: Hiroyuki Minato
- 申请人: SHIMADZU CORPORATION
- 申请人地址: JP Kyoto-shi
- 专利权人: SHIMADZU CORPORATION
- 当前专利权人: SHIMADZU CORPORATION
- 当前专利权人地址: JP Kyoto-shi
- 代理机构: Sughrue Mion, PLLC
- 优先权: JP2013-185593 20130906
- 主分类号: G01J3/42
- IPC分类号: G01J3/42 ; G01J3/18 ; G01J3/28
摘要:
Provided is a method for performing a wavelength calibration of a monochromator with a diffraction grating by casting light from a standard light source whose emission intensity contains a change with a predetermined cycle onto the diffraction grating and measuring an intensity of light reflected by the grating. The method includes the steps of: measuring at least two times the intensity of the reflected light from the grating within the aforementioned cycle at each of the rotational positions of the grating corresponding to a range of wavelengths including a peak wavelength of a bright line spectral light generated by the standard light source; determining an intensity value 201 at each rotational position based on all the measured values obtained at the rotational position; and locating, as the peak wavelength of the bright line spectral light, a wavelength at which the intensity value 201 is maximized.
公开/授权文献
- US20150070695A1 WAVELENGTH CALIBRATION METHOD FOR MONOCHROMATOR 公开/授权日:2015-03-12
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