- 专利标题: Apparatus and method for highly accurate real-time photoelectric glass substrate identification
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申请号: US14831929申请日: 2015-08-21
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公开(公告)号: US09760985B2公开(公告)日: 2017-09-12
- 发明人: Ta-Jen Kuo , Ron Tsai
- 申请人: Ta-Jen Kuo
- 申请人地址: TW Taipei
- 专利权人: TA-JEN KUO
- 当前专利权人: TA-JEN KUO
- 当前专利权人地址: TW Taipei
- 代理机构: Lin & Associates Intellectual Property, Inc.
- 优先权: TW104121499A 20150702
- 主分类号: G06K9/46
- IPC分类号: G06K9/46 ; G01N21/00 ; G06T7/00 ; G06T7/70
摘要:
The present invention provides an apparatus for highly accurate and real-time photoelectric glass substrate identification. The apparatus includes: a laser device for emitting a laser beam; a glass substrate that has a first surface and a second surface and is configured to receive the laser beam to generate a first laser beam point and a second laser beam point; and, a charged coupled device (CCD) camera inspecting equipment. The first laser beam point has a first point area, and the second laser beam point has a second point area. Once the first point area is moved for a glass distance number and is aligned with the second point area, the CCD camera inspecting equipment can obtain a thickness value of the glass substrate with a resolution value and the glass distance number. In addition, the present invention also provides a method for highly accurate and real-time photoelectric glass substrate identification.
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