Invention Grant
- Patent Title: Apparatus and method for analyzing image including event information
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Application No.: US14331405Application Date: 2014-07-15
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Publication No.: US09767571B2Publication Date: 2017-09-19
- Inventor: Jun Haeng Lee , Hyun Suk Ryu , Kyoobin Lee
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-Si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-Si
- Agency: Sughrue Mion, PLLC
- Priority: KR10-2013-0089254 20130729; KR10-2013-0098273 20130820
- Main IPC: G06T7/55
- IPC: G06T7/55 ; G06T7/246 ; G06T7/20
Abstract:
An apparatus and method for analyzing an image including event information for determining a pattern of at least one pixel group corresponding to event information included in an input image, and analyzes at least one of an appearance of an object and a motion of the object, based on the at least one pattern.
Public/Granted literature
- US20150030204A1 APPARATUS AND METHOD FOR ANALYZING IMAGE INCLUDING EVENT INFORMATION Public/Granted day:2015-01-29
Information query
