Invention Grant
- Patent Title: Gas analyzing apparatus and sampling device
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Application No.: US15115217Application Date: 2015-12-24
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Publication No.: US09772306B2Publication Date: 2017-09-26
- Inventor: Qingjun Zhang , Yuanjing Li , Zhiqiang Chen , Ziran Zhao , Yinong Liu , Yaohong Liu , Qiufeng Ma , Huishao He , Weiping Zhu , Xiang Zou , Jianping Chang , Song Liang
- Applicant: NUCTECH COMPANY LIMITED
- Applicant Address: CN Beijing
- Assignee: NUCTECH COMPANY LIMITED
- Current Assignee: NUCTECH COMPANY LIMITED
- Current Assignee Address: CN Beijing
- Agency: Pillsbury Winthrop Shaw Pittman LLP
- Priority: CN201410855715 20141231
- International Application: PCT/CN2015/098665 WO 20151224
- International Announcement: WO2016/107484 WO 20160707
- Main IPC: G01N27/00
- IPC: G01N27/00 ; G01N27/62 ; G01N27/64 ; G01N30/30 ; G01N30/46

Abstract:
The present invention discloses a gas analyzing apparatus and a sampling device. The gas analyzing apparatus includes a sampling device and an ion mobility spectrum analysis device. The sampling device includes a multi-capillary column and a temperature control system. The ion mobility spectrum analysis device is adapted for analyzing a gas leaded-in by the sampling device and includes a reaction cavity for reaction between sample molecules and reaction ions, the cavity having a sampling opening for leading-in of the gas. An outlet end of the multi-capillary column is inserted directly into the cavity of the ion mobility spectrum analysis device through the sampling opening of the ion mobility spectrum analysis device.
Public/Granted literature
- US20160341695A1 GAS ANALYZING APPARATUS AND SAMPLING DEVICE Public/Granted day:2016-11-24
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