Invention Grant
- Patent Title: Detection circuit
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Application No.: US15002686Application Date: 2016-01-21
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Publication No.: US09772365B2Publication Date: 2017-09-26
- Inventor: Masakazu Sugiura , Atsushi Igarashi
- Applicant: Seiko Instruments Inc.
- Applicant Address: JP
- Assignee: SII Semiconductor Corporation
- Current Assignee: SII Semiconductor Corporation
- Current Assignee Address: JP
- Agency: Brinks Gilson & Lione
- Priority: JP2015-011545 20150123; JP2015-078580 20150407
- Main IPC: G01R31/02
- IPC: G01R31/02 ; H03K17/18

Abstract:
Provided is a detection circuit configured to avoid erroneous detection that may occur immediately after a detection circuit is powered on. The detection circuit includes: an output transistor connected between a voltage input terminal and a voltage output terminal; and a load open-circuit detection circuit configured to detect an open circuit of a load connected to the voltage output terminal, in which an output circuit of the load open-circuit detection circuit includes a first transistor and a second transistor connected in series, the first transistor having a gate connected to the output transistor in common, the second transistor having a gate to which a signal indicating that the open-circuit of the load is detected, and in which the first transistor is in an off state when the output transistor is in an off state.
Public/Granted literature
- US20160216307A1 DETECTION CIRCUIT Public/Granted day:2016-07-28
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