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Patent Agency Ranking
公开(公告)号：US09059699B2
公开(公告)日：2015-06-16
申请号：US14029221
申请日：2013-09-17
Applicant: Seiko Instruments Inc.
Inventor： Tsutomu Tomioka , Atsushi Igarashi , Masakazu Sugiura
CPC classification number: H03K17/005 , G05F1/56 , H02J1/10
Abstract: Provided is a power supply switching circuit capable of suppressing a load fluctuation such as undershoot that occurs at an output terminal at the time of power supply switching. The power supply switching circuit includes: a battery connected to the output terminal; a replica current generation circuit for generating a replica current that is proportional to a current flowing from the battery to the output terminal; a voltage regulator connected to the output terminal, the voltage regulator including a reference voltage circuit, an error amplifier circuit, an output transistor, and a voltage divider circuit; and a current mirror circuit for causing the replica current to flow through the output transistor of the voltage regulator.
Abstract translation: 提供一种电源切换电路，其能够抑制在电源切换时在输出端子处发生的诸如下冲的负载波动。 电源开关电路包括：连接到输出端子的电池; 复制电流产生电路，用于产生与从电池流向输出端的电流成比例的复制电流; 连接到输出端子的电压调节器，所述电压调节器包括参考电压电路，误差放大器电路，输出晶体管和分压器电路; 以及用于使复制电流流过电压调节器的输出晶体管的电流镜电路。
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公开(公告)号：US09983067B2
公开(公告)日：2018-05-29
申请号：US14692883
申请日：2015-04-22
Applicant: Seiko Instruments Inc.
Inventor： Masakazu Sugiura , Tsutomu Tomioka , Hideyuki Sawai , Atsushi Igarashi , Nao Otsuka , Daisuke Okano
CPC classification number: G01K7/01 , G01K3/005 , H01L27/0255
Abstract: Provided is an overheat detection circuit configured to accurately detect a temperature of a semiconductor device even at high temperature and thus avoid outputting an erroneous detection result. The overheat detection circuit includes: a PN junction element, being a temperature sensitive element; a constant current circuit configured to supply the PN junction element with a bias current; a comparator configured to compare a voltage generated at the PN junction element and a reference voltage; a second PN junction element configured to cause a leakage current to flow through a reference voltage circuit at high temperature; and a third PN junction element configured to bypass a leakage current of the constant current circuit at the high temperature.
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3.发明授权公开(公告)号：US09454174B2
公开(公告)日：2016-09-27
申请号：US14693460
申请日：2015-04-22
Applicant: Seiko Instruments Inc.
Inventor： Atsushi Igarashi , Nao Otsuka
IPC: G05F5/00
CPC classification number: G05F5/00
Abstract: Provided is a power supply voltage monitoring circuit capable of accurately detecting a power supply voltage with a small circuit scale and low power consumption. The power supply voltage monitoring circuit includes: a signal output circuit configured to output a signal voltage representing saturation characteristics with respect to an increase in power supply voltage; and a signal voltage monitoring circuit configured to output a signal representing that the signal voltage of the signal output circuit is normal, the signal voltage monitoring circuit including: a PMOS transistor including a gate connected to an output terminal of the signal output circuit; a first constant current circuit connected to a drain of the PMOS transistor; and an inverter including an input terminal connected to the drain of the PMOS transistor.
Abstract translation: 提供一种能够以小的电路规模和低功耗精确地检测电源电压的电源电压监视电路。 电源电压监视电路包括：信号输出电路，被配置为输出表示相对于电源电压的增加的饱和特性的信号电压; 信号电压监视电路，被配置为输出表示信号输出电路的信号电压正常的信号，所述信号电压监视电路包括：PMOS晶体管，包括与所述信号输出电路的输出端连接的栅极; 连接到PMOS晶体管的漏极的第一恒流电路; 以及反相器，包括连接到PMOS晶体管的漏极的输入端子。
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公开(公告)号：US09772365B2
公开(公告)日：2017-09-26
申请号：US15002686
申请日：2016-01-21
Applicant: Seiko Instruments Inc.
Inventor： Masakazu Sugiura , Atsushi Igarashi
CPC classification number: G01R31/026 , H03K17/18 , H03K2217/0054
Abstract: Provided is a detection circuit configured to avoid erroneous detection that may occur immediately after a detection circuit is powered on. The detection circuit includes: an output transistor connected between a voltage input terminal and a voltage output terminal; and a load open-circuit detection circuit configured to detect an open circuit of a load connected to the voltage output terminal, in which an output circuit of the load open-circuit detection circuit includes a first transistor and a second transistor connected in series, the first transistor having a gate connected to the output transistor in common, the second transistor having a gate to which a signal indicating that the open-circuit of the load is detected, and in which the first transistor is in an off state when the output transistor is in an off state.
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公开(公告)号：US09030249B2
公开(公告)日：2015-05-12
申请号：US14182950
申请日：2014-02-18
Applicant: Seiko Instruments Inc.
Inventor： Kosuke Takada , Atsushi Igarashi
IPC: H03L5/00 , H03L5/02 , H03K3/356 , H03K19/0185
CPC classification number: H03L5/02 , H03K3/356086 , H03K19/018507
Abstract: There is provided a level shift circuit free from malfunction. The level shift circuit converts a signal of a first power supply voltage of a first supply terminal, which is supplied to an input terminal, into a signal of a second power supply voltage of a second supply terminal and outputs the converted signal to an output terminal. The level shift circuit has a control circuit that detects when the first power supply voltage reduces below a predetermined voltage. The voltage of the output terminal of the level shift circuit is fixed to the second power supply voltage or a ground voltage according to a detection signal of the control circuit.
Abstract translation: 提供了一个没有故障的电平转换电路。 电平移位电路将提供给输入端子的第一电源端子的第一电源电压的信号转换为第二电源端子的第二电源电压的信号，并将转换的信号输出到输出端子 。 电平移位电路具有检测第一电源电压何时降低到预定电压以下的控制电路。 电平移位电路的输出端子的电压根据控制电路的检测信号固定在第二电源电压或接地电压上。
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