Invention Grant
- Patent Title: Method and apparatus for generating test bench for verification of processor decoder
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Application No.: US14259481Application Date: 2014-04-23
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Publication No.: US09772917B2Publication Date: 2017-09-26
- Inventor: Seong-hoon Jeong , Ho-young Kim , Soo-jung Ryu
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Gyeonggi-Do
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Gyeonggi-Do
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: KR10-2013-0120195 20131008
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/22 ; G06F11/263 ; G06F11/36
Abstract:
A method and apparatus for generating a test bench for verifying a processor decoder are provided. The method including receiving an architecture description comprising processor decoder information, parsing the received architecture description into information for verifying the processor decoder, and generating the test bench to verify the processor decoder based on the parsed information.
Public/Granted literature
- US20150100833A1 METHOD AND APPARATUS FOR GENERATING TEST BENCH FOR VERIFICATION OF PROCESSOR DECODER Public/Granted day:2015-04-09
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