Invention Grant
- Patent Title: Method and terminal for determining frequency to be measured
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Application No.: US14538487Application Date: 2014-11-11
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Publication No.: US09781617B2Publication Date: 2017-10-03
- Inventor: Yanyan Chen , Bingzhao Li , Yu Gong
- Applicant: Huawei Technologies Co., Ltd.
- Applicant Address: CN Shenzhen
- Assignee: Huawei Technologies Co., Ltd.
- Current Assignee: Huawei Technologies Co., Ltd.
- Current Assignee Address: CN Shenzhen
- Agency: Leydig, Voit & Mayer, Ltd.
- Main IPC: H04W24/08
- IPC: H04W24/08 ; H04W48/16

Abstract:
The present application provides a method and a terminal for determining a frequency to be measured. The terminal receives frequency information about an inter-frequency measurement object and frequency priority information about the inter-frequency measurement object, and determines the number of at least one frequency for the received inter-frequency measurement object according to the frequency information, and when the number of the at least one frequency for the received inter-frequency measurement object is greater than the number of at least one frequency for an inter-frequency measurement object supported by the terminal, the terminal is capable of selecting, according to the frequency priority information, at least one frequency to be measured from the at least one frequency for the received inter-frequency measurement object, wherein the number of the at least one frequency to be measured is equal to the number of frequencies for the inter-frequency measurement object supported by the terminal.
Public/Granted literature
- US20150063156A1 METHOD AND TERMINAL FOR DETERMINING FREQUENCY TO BE MEASURED Public/Granted day:2015-03-05
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