Invention Grant
- Patent Title: Single view feature-less depth and texture calibration
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Application No.: US14865211Application Date: 2015-09-25
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Publication No.: US09794545B2Publication Date: 2017-10-17
- Inventor: Alex Bronstein , Aviad Zabatani , Ron Kimmel , Michael Bronstein , Erez Sperling , Vitaly Surazhsky
- Applicant: Intel Corporation
- Applicant Address: US CA Santa Clara
- Assignee: INTEL CORPORATION
- Current Assignee: INTEL CORPORATION
- Current Assignee Address: US CA Santa Clara
- Agency: Blakely Sokoloff Taylor and Zafman LLP
- Main IPC: H04N13/02
- IPC: H04N13/02 ; G06T7/00 ; H04N13/00

Abstract:
A method and apparatus for performing a single view depth and texture calibration are described. In one embodiment, the apparatus comprises a calibration unit operable to perform a single view calibration process using a captured single view a target having a plurality of plane geometries having detectable features and being at a single orientation and to generate calibration parameters to calibrate one or more of the projector and multiple cameras using the single view of the target.
Public/Granted literature
- US20170094256A1 SINGLE-VIEW FEATURE-LESS DEPTH AND TEXTURE CALIBRATION Public/Granted day:2017-03-30
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