Invention Grant
- Patent Title: Method and apparatus for correcting cache profiling information in multi-pass simulator
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Application No.: US15032867Application Date: 2014-03-12
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Publication No.: US09798664B2Publication Date: 2017-10-24
- Inventor: Jin-seok Lee , Tai-song Jin
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-Si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-Si
- Agency: Sughrue Mion, PLLC
- Priority: KR10-2013-0128654 20131028
- International Application: PCT/KR2014/002034 WO 20140312
- International Announcement: WO2015/064856 WO 20150507
- Main IPC: G06F17/50
- IPC: G06F17/50 ; G06F12/0815 ; G06F11/26 ; G06F11/34

Abstract:
Provided method includes storing a first cache snap shot including cache profiling information regarding a cache when a first process being executed by a cycle accurate simulator is terminated; storing a second cache snap shot including the cache profiling information on the cache when a second process is executed in the cycle accurate simulator; comparing the second cache snap shot of the second process and the first cache snap shot of the first process to readjust any one value of a cache hit value and a cache miss value which are present in the second cache snap shot of the second process; and correcting the cache profiling information which is stored in the first cache snap shot of the first process by reflecting the readjusted any one value of the cache hit value and the cache miss value present in the second cache snap shot of the second process.
Public/Granted literature
- US20160253261A1 METHOD AND APPARATUS FOR CORRECTING CACHE PROFILING INFORMATION IN MULTI-PASS SIMULATOR Public/Granted day:2016-09-01
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