Invention Grant
- Patent Title: Measuring probe for measuring a three-dimensional shape of an object to be measured
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Application No.: US14789266Application Date: 2015-07-01
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Publication No.: US09810529B2Publication Date: 2017-11-07
- Inventor: Atsushi Shimaoka , Tomoyuki Miyazaki , Kazuhiko Hidaka
- Applicant: MITUTOYO CORPORATION
- Applicant Address: JP Kanagawa
- Assignee: MITOTOYO CORPORATION
- Current Assignee: MITOTOYO CORPORATION
- Current Assignee Address: JP Kanagawa
- Agency: Greenblum & Bernstein, P.L.C.
- Priority: JP2015-043035 20150305
- Main IPC: G01B11/24
- IPC: G01B11/24 ; G01B11/00 ; G01B11/14 ; G01B5/00 ; G01B5/012

Abstract:
A measuring probe includes a stylus having a contact part to be in contact with an object to be measured, an axial motion mechanism having a moving member that allows the contact part to move in an axial direction, and a rotary motion mechanism having a rotating member that allows the contact part to move along a plane perpendicular to the axial direction by means of rotary motion. The measuring probe includes a main body housing that supports the axial motion mechanism, a module housing that supports the rotary motion mechanism, and a displacement detector supported by the main body housing for detecting displacement of the moving member. The measuring probe with this configuration ensures high measurement accuracy while keeping a low cost.
Public/Granted literature
- US20160258744A1 MEASURING PROBE Public/Granted day:2016-09-08
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