发明授权
- 专利标题: Method for analysing a sample comprising at least a first and a second scale inhibitor
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申请号: US15037682申请日: 2014-11-18
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公开(公告)号: US09816927B2公开(公告)日: 2017-11-14
- 发明人: Vesa Nuutinen , Susanna Toivonen , James Johnstone , Harri Härmä , Mirva Lehmusto , Satu Tiittanen , Pave Väisänen , Joonas Siivonen , Paul Mundill
- 申请人: Kemira Oyj
- 申请人地址: FI Helsinki
- 专利权人: KEMIRA OYJ
- 当前专利权人: KEMIRA OYJ
- 当前专利权人地址: FI Helsinki
- 代理机构: Berggren Inc.
- 优先权: FI20136152 20131119
- 国际申请: PCT/FI2014/050878 WO 20141118
- 国际公布: WO2015/075309 WO 20150528
- 主分类号: G01N21/64
- IPC分类号: G01N21/64 ; G01N21/77 ; G01N1/34 ; G01N1/38
摘要:
The invention relates to a method for analysing a sample comprising at least a first and a second scale inhibitor, which scale inhibitors are synthetic organic compounds comprising at least one ionised group. The method comprises optionally diluting and/or purifying the sample, and allowing the sample interact with a reagent comprising lanthanide(III) ion. The sample is excited at a first excitation wavelength and a sample signal deriving from the lanthanide(III) ion is detected at a signal wavelength by using time-resolved luminescence measurement. The total concentration of the first and the second scale inhibitor is determined by using the detected sample signal, and the concentration of the first scale inhibitor in the sample is determined. The concentration of the second scale inhibitor is determined mathematically by using the obtained results for the total concentration and for the first scale inhibitor concentration.
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