Invention Grant
- Patent Title: Test carrier for mounting and testing an electronic device
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Application No.: US14736843Application Date: 2015-06-11
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Publication No.: US09817024B2Publication Date: 2017-11-14
- Inventor: Hidenobu Matsumura , Noriyuki Masuda
- Applicant: ADVANTEST CORPORATION
- Applicant Address: JP Tokyo
- Assignee: ADVANTEST CORPORATION
- Current Assignee: ADVANTEST CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Greenblum & Bernstein, P.L.C.
- Priority: JP2014-137364 20140703
- Main IPC: G01R1/04
- IPC: G01R1/04 ; G01R31/28
Abstract:
A test carrier includes a base member on which a first electronic device under test is able to be temporarily mounted, and a second electronic device which is configured to be used to test the first electronic device. The second electronic device is mounted on the base member, and the second electronic device is able to be electrically connected to the first electronic device.
Public/Granted literature
- US20160003869A1 TEST CARRIER Public/Granted day:2016-01-07
Information query
