A memory device includes a first memory block suitable for transmitting and receiving signals through a first channel, a second memory block suitable for transmitting and receiving signals through a second channel, and a test control unit suitable for applying a first command signal among a plurality of command signals to the first and second channels at different values, while applying the plurality of command signals from an exterior of the memory device to the first and second channels in a test operation, wherein the first command signal distinguishes write and read operations of the first and second memory blocks, wherein, when the first memory block performs a read operation in the test operation, the second memory block performs a write operation, and data outputted from the first memory block is inputted to the second memory block.