- 专利标题: Semiconductor memory devices
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申请号: US15403829申请日: 2017-01-11
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公开(公告)号: US09831260B2公开(公告)日: 2017-11-28
- 发明人: Gang Zhang , Hyuk Kim , Yong-Hyun Kwon , Sangwuk Park
- 申请人: Gang Zhang , Hyuk Kim , Yong-Hyun Kwon , Sangwuk Park
- 申请人地址: KR
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人地址: KR
- 代理机构: Myers Bigel, P.A.
- 优先权: KR10-2016-0025228 20160302
- 主分类号: H01L29/76
- IPC分类号: H01L29/76 ; G11C11/34 ; H01L27/11573 ; H01L27/12 ; H01L23/522 ; H01L27/11575 ; H01L27/11582 ; H01L27/092 ; H01L27/118
摘要:
Provided is a semiconductor memory device. The semiconductor memory device includes a peripheral circuit gate pattern on a first substrate, an impurity region in the first substrate and spaced apart from the peripheral circuit gate pattern, a cell array structure on the peripheral circuit gate pattern, a second substrate between the peripheral circuit gate pattern and the cell array structure, and a via that is in contact with the impurity region and disposed between the first substrate and the second substrate. The via electrically connects the first and second substrates to each other.
公开/授权文献
- US20170256558A1 Semiconductor Memory Devices 公开/授权日:2017-09-07
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