Invention Grant
- Patent Title: Method and device for interferer scheduling detection and noise and interferer parameter estimation
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Application No.: US14660094Application Date: 2015-03-17
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Publication No.: US09832667B2Publication Date: 2017-11-28
- Inventor: Stefan Fechtel
- Applicant: Intel IP Corporation
- Applicant Address: US CA Santa Clara
- Assignee: Intel IP Corporation
- Current Assignee: Intel IP Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Schiff Hardin LLP
- Priority: DE102014103853 20140320
- Main IPC: H04W24/02
- IPC: H04W24/02 ; H04L5/00 ; H04W72/12
Abstract:
A method for estimating noise and interferer parameters includes receiving a signal comprising a noise and interference signal contribution. Noise and interference power samples are generated based on the signal. The noise and interference power samples are quantized into quantization levels. The occurrences of noise and interference power samples are accumulated for each quantization level during an observation period. Noise and interferer parameters are estimated based on the number of occurrences of noise and interference power samples per quantization level during the observation period.
Public/Granted literature
- US20150271687A1 METHOD AND DEVICE FOR INTERFERER SCHEDULING DETECTION AND NOISE AND INTERFERER PARAMETER ESTIMATION Public/Granted day:2015-09-24
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