Invention Grant
- Patent Title: Strain inspection device and attaching method thereof
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Application No.: US15146493Application Date: 2016-05-04
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Publication No.: US09841365B2Publication Date: 2017-12-12
- Inventor: Hanna Noh , Injoong Kim , Sungsuu Kim , Gayoung Ryu , Youngho Cha , Joungwook Park
- Applicant: LG ELECTRONICS INC.
- Applicant Address: KR Seoul
- Assignee: LG ELECTRONICS INC.
- Current Assignee: LG ELECTRONICS INC.
- Current Assignee Address: KR Seoul
- Agency: KED & Associates, LLP
- Priority: KR10-2015-0086057 20150617
- Main IPC: G01N3/34
- IPC: G01N3/34 ; G01N3/20 ; G01N33/00

Abstract:
A strain inspection device of a printed circuit board (PCB) which is easily cracked or damaged by external pressure (force) applied to the PCB while the PCB is being assembled, and an attaching method thereof. The strain inspection device of a printed circuit board (PCB) includes a fixing member; and a damage indicator fixed to the PCB by the fixing member, having a crack guide through hole, and cracked or damaged along a corner of the crack guide through hole due to deformation of the PCB.
Public/Granted literature
- US20160370270A1 STRAIN INSPECTION DEVICE AND ATTACHING METHOD THEREOF Public/Granted day:2016-12-22
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