Invention Grant
- Patent Title: Ultra low temperature drift bandgap reference with single point calibration technique
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Application No.: US14530448Application Date: 2014-10-31
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Publication No.: US09851731B2Publication Date: 2017-12-26
- Inventor: Rajeev Jain , Chandrajit Debnath
- Applicant: STMicroelectronics International N.V.
- Applicant Address: NL Schiphol
- Assignee: STMicroelectronics International N.V.
- Current Assignee: STMicroelectronics International N.V.
- Current Assignee Address: NL Schiphol
- Agency: Seed Intellectual Property Law Group LLP
- Main IPC: G05F1/46
- IPC: G05F1/46 ; G05F3/16 ; G05F3/30 ; G05F3/26
Abstract:
A bandgap voltage generator includes a plurality of calibration transistors. A test circuit measures the bandgap reference voltage generated by the bandgap voltage generator and enables a subset of the calibration transistors to correct to the bandgap reference voltage.
Public/Granted literature
- US20160124445A1 ULTRA LOW TEMPERATURE DRIFT BANDGAP REFERENCE WITH SINGLE POINT CALIBRATION TECHNIQUE Public/Granted day:2016-05-05
Information query
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