Invention Grant
- Patent Title: Specimen storage apparatus, specimen processing system, and controlling method thereof
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Application No.: US14423473Application Date: 2013-08-28
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Publication No.: US09857389B2Publication Date: 2018-01-02
- Inventor: Masashi Endo , Tatsuya Fukugaki , Yoshiteru Hirama , Kazuma Tamura
- Applicant: Hitachi High-Technologies Corporation
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- Priority: JP2012-200068 20120912; JP2012-215459 20120928
- International Application: PCT/JP2013/073046 WO 20130828
- International Announcement: WO2014/042011 WO 20140320
- Main IPC: G01N35/02
- IPC: G01N35/02 ; G01N35/00 ; G01N35/04

Abstract:
The specimen storage apparatus includes: a specimen conveyor line which conveys a specimen for which the pre-processing is completed and which is installed on a specimen conveyance holder; a lift mechanism capable of driving a specimen tray having the specimen installed therein in front-and-back and vertical directions; a specimen chuck mechanism which transfers the specimen from a specimen acquisition position of the specimen conveyor line to the specimen tray on the lift mechanism; a specimen storage unit which receives the specimen tray from the lift mechanism, includes hierarchical specimen storage spaces in a vertical direction, and accommodates a plurality of specimen trays in a lateral direction while keeping them cold; a shutter mechanism which is opened and closed at the time of delivery of the specimen tray between the lift mechanism and the specimen storage unit; and a control unit which controls each of the mechanisms.
Public/Granted literature
- US20160202279A1 SPECIMEN STORAGE APPARATUS, SPECIMEN PROCESSING SYSTEM, AND CONTROLLING METHOD THEREOF Public/Granted day:2016-07-14
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