发明授权
- 专利标题: Scaling of image data in sensor interface based on detection of defective pixels
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申请号: US15198363申请日: 2016-06-30
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公开(公告)号: US09860429B1公开(公告)日: 2018-01-02
- 发明人: D. Amnon Silverstein , Jaewon Shin
- 申请人: Apple Inc.
- 申请人地址: US CA Cupertino
- 专利权人: Apple Inc.
- 当前专利权人: Apple Inc.
- 当前专利权人地址: US CA Cupertino
- 代理机构: Fenwick & West LLP
- 主分类号: H04N5/225
- IPC分类号: H04N5/225 ; H04N5/217 ; G06T7/00 ; G06T3/40 ; G06T1/20 ; G06T5/00 ; G06T5/20
摘要:
Embodiments of the present disclosure relate to a sensor interface circuit that performs scaling of image data in a Bayer pattern without spreading defective pixels across multiple pixels. The sensor interface circuit may include a register circuit storing operating parameters of the sensor interface circuit. The sensor interface circuit includes a scaling circuit with a first defect pixel detection circuit to detect a first defective pixel in an input image by analyzing pixels in a line of an input image data along a first direction. A first scaling circuit is coupled to the first defect pixel detection circuit and generates a scaled line of pixels representing the line of the input image scaled along the first direction according to the operating parameters.
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