Invention Grant
- Patent Title: Method of inspecting sapphire structures and method of forming the same
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Application No.: US14175845Application Date: 2014-02-07
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Publication No.: US09863927B2Publication Date: 2018-01-09
- Inventor: Dale N. Memering , Matthew S. Rogers , Scott A. Myers
- Applicant: Apple Inc.
- Applicant Address: US CA Cupertino
- Assignee: APPLE INC.
- Current Assignee: APPLE INC.
- Current Assignee Address: US CA Cupertino
- Agency: Brownstein Hyatt Farber Schreck, LLP
- Main IPC: G01N33/38
- IPC: G01N33/38 ; G01N21/958 ; G01B21/20
Abstract:
A method of inspecting and forming sapphire structures. The method of inspecting a sapphire structure may include providing an annealed sapphire structure, and measuring a profile of at least a portion of the annealed sapphire structure. The profile of at least the portion of the annealed sapphire structure may be measured using a non-x-ray based measuring device. Additionally, the method of inspecting may include identifying a defect within at least a portion of the measured profile of the annealed sapphire structure.
Public/Granted literature
- US20150226723A1 METHOD OF INSPECTING SAPPHIRE STRUCTURES AND METHOD OF FORMING THE SAME Public/Granted day:2015-08-13
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