发明授权
- 专利标题: Memory cell
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申请号: US15225642申请日: 2016-08-01
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公开(公告)号: US09865349B2公开(公告)日: 2018-01-09
- 发明人: Jhon Jhy Liaw
- 申请人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 申请人地址: TW Hsin-Chu
- 专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人地址: TW Hsin-Chu
- 代理机构: Slater Matsil, LLP
- 主分类号: G11C15/04
- IPC分类号: G11C15/04 ; H01L27/105 ; H01L23/528 ; H01L23/522 ; H01L27/02 ; H01L27/088
摘要:
Cell layouts for a memory cell, such as for ternary content addressable memory (TCAM), are disclosed. Some cell layouts include a well strap structure. A cell layout may include a p-doped well, an n-doped well, and a p-doped well sequentially along a layout. Another cell layout may include a p-doped well, an n-doped well, a p-doped well, and an n-doped well sequentially along a layout. A well strap structure may be in a p-doped well or an n-doped well. Various metallization layers having a mesh may be used with a memory cell layout. In some disclosed examples, a first metallization layer may have one, two, or four ground traces, and a second metallization layer may have two ground traces. These various ground traces may be electrically coupled together to form a mesh.
公开/授权文献
- US20160343437A1 Memory Cell 公开/授权日:2016-11-24
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