An X-ray inspection system of the present application is capable of blocking the effect of heat from an X-ray source, thereby making it possible to place a heat-sensitive circuit component in the same housing space as the X-ray source. The X-ray inspection system includes a housing 10 provided with an upper housing space 11, in which an X-ray source 32 housed in a cooling container 30 is placed. Due to pressure of a pump 36, a cooling medium circulates between the cooling container 30 and a heat radiating device 33, thereby suppressing the temperature rise of the cooling container 30. Since the cooling container 30 is placed in the upper housing space 11, the upper housing space 11 serves as a cooling space, suppressing the temperature rise. Therefore, heat-sensitive or heat-producing circuit components can be placed in the upper housing space 11.