Invention Grant
- Patent Title: Memory device for performing calibration operation
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Application No.: US15295571Application Date: 2016-10-17
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Publication No.: US09870808B2Publication Date: 2018-01-16
- Inventor: Hyunui Lee , Won-joo Yun , Hye-seung Yu , In-dal Song
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Samsung-ro, Yeongtong-gu, Suwon-si, Gyeonggi-do
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Samsung-ro, Yeongtong-gu, Suwon-si, Gyeonggi-do
- Agency: Muir Patent Law, PLLC
- Priority: KR10-2015-0170665 20151202
- Main IPC: G11C7/00
- IPC: G11C7/00 ; G11C7/12 ; G06F3/06 ; G11C7/22 ; G11C8/08 ; G11C8/14 ; G11C29/12

Abstract:
Provided is a memory device configured to perform a calibration operation without having a ZQ pin. The memory device includes a calibration circuit configured to generate a pull-up calibration code and a pull-down calibration code which termination of a data input/output pad for impedance matching in the data input/output pad is controlled. The calibration circuit performs a first calibration operation for trimming first and second reference resistors based on an external resistor to be connected to a pad, and a second calibration operation for generating the pull-up calibration code and the pull-down calibration code based on the trimmed second reference resistor.
Public/Granted literature
- US20170162238A1 MEMORY DEVICE FOR PERFORMING CALIBRATION OPERATION Public/Granted day:2017-06-08
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