Invention Grant
- Patent Title: Methods of fabricating a semiconductor device
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Application No.: US15244265Application Date: 2016-08-23
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Publication No.: US09871122B2Publication Date: 2018-01-16
- Inventor: In-Wook Oh , Hyunjae Lee , Jaeseok Yang
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si, Gyeonggi-Do
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si, Gyeonggi-Do
- Agency: F. Chau & Associates, LLC
- Priority: KR10-2015-0167578 20151127
- Main IPC: H01L21/336
- IPC: H01L21/336 ; H01L29/66 ; H01L27/11573 ; H01L27/11575 ; H01L27/32 ; H01L23/528 ; H01L21/768

Abstract:
A method of fabricating a semiconductor device includes providing a substrate that includes first and second main regions and a dummy region, and forming dummy active patterns on the dummy region. The first and second main regions are spaced apart from each other in a first direction and the dummy region includes a dummy connection region between the first and second main regions and first and second dummy cell regions spaced apart from each other in a second direction. First dummy active patterns, second dummy active patterns, and connection dummy active patterns connecting some of the first dummy active patterns to some of the second dummy active patterns are provided on the first and second dummy cell regions and the dummy connection region, respectively.
Public/Granted literature
- US20170154976A1 METHODS OF FABRICATING A SEMICONDUCTOR DEVICE Public/Granted day:2017-06-01
Information query
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