Invention Grant
- Patent Title: Ultrasound measurement of biometrics of fetus
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Application No.: US13734217Application Date: 2013-01-04
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Publication No.: US09881125B2Publication Date: 2018-01-30
- Inventor: Hae-kyung Jung , Hee-chul Yoon , Hyun-taek Lee , Yong-je Kim , Jae-hyun Kim , Myung-jin Eom
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: Sughrue Mion, PLLC
- Priority: KR10-2012-0001150 20120104
- Main IPC: G06F19/26
- IPC: G06F19/26 ; A61B8/08 ; A61B8/00
Abstract:
A method for measuring biometrics of an object includes receiving an image of an object, modeling the object to identify a portion of the object, and measuring biometrics of the object based on a modeling result the object.
Public/Granted literature
- US20130173175A1 METHOD AND APPARATUS FOR MEASURING BIOMETRICS OF OBJECT Public/Granted day:2013-07-04
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