Invention Grant
- Patent Title: Testing system and method
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Application No.: US13725091Application Date: 2012-12-21
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Publication No.: US09881510B2Publication Date: 2018-01-30
- Inventor: Daniel Scott Groninger , Robert Carroll Ward , Francois Xavier de Fromont , Chad Martin Shaffer
- Applicant: General Electric Company
- Applicant Address: US NY Schenectady
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Schenectady
- Agency: Fletcher Yoder, P.C.
- Main IPC: G01N29/04
- IPC: G01N29/04 ; G09B5/00 ; G01N29/22 ; G09B19/24

Abstract:
A testing system for use in conducting testing of a structure, and a method for configuring a testing system are provided. The testing system includes a testing device that includes a presentation interface, a user input interface, a memory device and a processor coupled in communication with the presentation interface, the user input interface, and the memory device. The processor causes the testing device to present to a user, prior to a test session, at least one demonstrative instruction for conducting a test session using the testing device, and at least one test instruction for use while the user is conducting a test session using the device.
Public/Granted literature
- US20140178853A1 TESTING SYSTEM AND METHOD Public/Granted day:2014-06-26
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