Invention Grant
- Patent Title: Charge mirror-based sensing for ferroelectric memory
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Application No.: US15173310Application Date: 2016-06-03
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Publication No.: US09881661B2Publication Date: 2018-01-30
- Inventor: Xinwei Guo , Daniele Vimercati
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: MICRON TECHNOLOGY, INC.
- Current Assignee: MICRON TECHNOLOGY, INC.
- Current Assignee Address: US ID Boise
- Agency: Holland & Hart LLP
- Main IPC: G11C11/22
- IPC: G11C11/22

Abstract:
Methods, systems, and devices for a sensing scheme that extracts the full or nearly full remnant polarization charge difference between two logic states of a ferroelectric memory cell or cells is described. The scheme employs a charge mirror to extract the full charge difference between the two states of a selected memory cell. The charge mirror may transfer the memory cell polarization charge to an amplification capacitor. The signal on the amplification capacitor may then be compared with a reference voltage to detect the logic state of the memory cell.
Public/Granted literature
- US20170352397A1 CHARGE MIRROR-BASED SENSING FOR FERROELECTRIC MEMORY Public/Granted day:2017-12-07
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