Invention Grant
- Patent Title: Sensing chip package and a manufacturing method thereof
-
Application No.: US15226327Application Date: 2016-08-02
-
Publication No.: US09887229B2Publication Date: 2018-02-06
- Inventor: Yen-Shih Ho , Tsang-Yu Liu , Chia-Sheng Lin , Chia-Ming Cheng
- Applicant: XINTEC INC.
- Applicant Address: TW Taoyuan
- Assignee: XINTEC INC.
- Current Assignee: XINTEC INC.
- Current Assignee Address: TW Taoyuan
- Agency: Liu & Liu
- Main IPC: H01L27/146
- IPC: H01L27/146

Abstract:
This present invention provides a method of manufacturing a chip scale sensing chip package, comprising the steps of: providing a sensing device wafer having a first top surface and a first bottom surface opposite to each other, whereby the sensing device wafer comprises a plurality of chip areas, and each of the chip areas comprising a sensing device and a plurality of conductive pads adjacent to the sensing chip nearby the first top surface; providing a cap wafer having a second top surface and a second bottom surface opposite to each other, and bonding the second surface of the cap wafer to the first top surface of the sensing device wafer by sandwiching a first adhesive layer therebetween; providing a temporary carrier substrate, and bonding the temporary carrier substrate to the second top surface of the cap wafer by sandwiching a second adhesive layer therebetween; forming a wiring layer connecting to each of the conductive pads on the first bottom surface of the sensing device wafer; providing a first protective layer on the wiring layer; removing the temporary carrier substrate and the second adhesive layer; forming a second protective layer on the second top surface; removing the first protective layer; scribing the chip areas to generate a plurality of individual chip scale sensing chip package; and removing the second protective layer.
Public/Granted literature
- US20170040372A1 SENSING CHIP PACKAGE AND A MANUFACTURING METHOD THEREOF Public/Granted day:2017-02-09
Information query
IPC分类: