- 专利标题: Scan chain circuit and integrated circuit including the same
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申请号: US14706224申请日: 2015-05-07
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公开(公告)号: US09897655B2公开(公告)日: 2018-02-20
- 发明人: In-Gyu Park , Dong-Wook Seo , Chan-Ho Lee
- 申请人: SAMSUNG ELECTRONICS CO., LTD.
- 申请人地址: KR Suwon-si
- 专利权人: SAMSUNG ELECTRONICS CO., LTD.
- 当前专利权人: SAMSUNG ELECTRONICS CO., LTD.
- 当前专利权人地址: KR Suwon-si
- 代理机构: Sughrue Mion, PLLC
- 优先权: KR10-2014-0084397 20140707
- 主分类号: G01R31/3185
- IPC分类号: G01R31/3185 ; H03K3/037
摘要:
A scan chain circuit includes first through N-th flip-flops connected in series to sequentially transfer data in response to a control signal, where N is an integer greater than 1. In the first through N-th flip-flops, the data are transferred in a first direction from the first flip-flop to the N-th flip-flop. The control signal is applied to the first through N-th flip-flops in a second direction opposite to the first direction from the N-th flip-flop to the first flip-flop.