• Patent Title: Sample measuring device
  • Application No.: US15028157
    Application Date: 2014-09-30
  • Publication No.: US09903965B2
    Publication Date: 2018-02-27
  • Inventor: Tomonori HanayaYujiro Akuta
  • Applicant: Hitachi, Ltd.
  • Applicant Address: JP Tokyo
  • Assignee: Hitachi, Ltd.
  • Current Assignee: Hitachi, Ltd.
  • Current Assignee Address: JP Tokyo
  • Priority: JP2013-211913 20131009; JP2013-211917 20131009
  • International Application: PCT/JP2014/076174 WO 20140930
  • International Announcement: WO2015/053134 WO 20150416
  • Main IPC: G01T7/08
  • IPC: G01T7/08 G01N35/04 G01T1/204
Sample measuring device
Abstract:
Each adapter disposed on a rack includes a pair of arms that configure an opening/closing mechanism. During rack conveyance, a guiding block is slotted between a pair of legs contained in the rack. The opening/closing mechanism being abutted against the guiding block causes the opening/closing mechanism to perform an opening/closing operation. When the state of the opening/closing mechanism is changed from closed to open, a pre-measurement sample container is passed from a sample storage unit to a lifting mechanism. Subsequent to the post-measurement sample container being returned to the sample storage unit, the state of the opening/closing mechanism is changed from open to closed.
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