Invention Grant
- Patent Title: Sample measuring device
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Application No.: US15028157Application Date: 2014-09-30
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Publication No.: US09903965B2Publication Date: 2018-02-27
- Inventor: Tomonori Hanaya , Yujiro Akuta
- Applicant: Hitachi, Ltd.
- Applicant Address: JP Tokyo
- Assignee: Hitachi, Ltd.
- Current Assignee: Hitachi, Ltd.
- Current Assignee Address: JP Tokyo
- Priority: JP2013-211913 20131009; JP2013-211917 20131009
- International Application: PCT/JP2014/076174 WO 20140930
- International Announcement: WO2015/053134 WO 20150416
- Main IPC: G01T7/08
- IPC: G01T7/08 ; G01N35/04 ; G01T1/204

Abstract:
Each adapter disposed on a rack includes a pair of arms that configure an opening/closing mechanism. During rack conveyance, a guiding block is slotted between a pair of legs contained in the rack. The opening/closing mechanism being abutted against the guiding block causes the opening/closing mechanism to perform an opening/closing operation. When the state of the opening/closing mechanism is changed from closed to open, a pre-measurement sample container is passed from a sample storage unit to a lifting mechanism. Subsequent to the post-measurement sample container being returned to the sample storage unit, the state of the opening/closing mechanism is changed from open to closed.
Public/Granted literature
- US20160252634A1 SAMPLE MEASURING DEVICE Public/Granted day:2016-09-01
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