- 专利标题: Nonvolatile memory device and operating method of nonvolatile memory device
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申请号: US15370079申请日: 2016-12-06
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公开(公告)号: US09905299B2公开(公告)日: 2018-02-27
- 发明人: Changkyu Seol , Junjin Kong , Youngsuk Ra , Hyejeong So , Hong Rak Son
- 申请人: Changkyu Seol , Junjin Kong , Youngsuk Ra , Hyejeong So , Hong Rak Son
- 申请人地址: KR Suwon-si, Gyeonggi-do
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人地址: KR Suwon-si, Gyeonggi-do
- 代理机构: Volentine & Whitt, PLLC
- 优先权: KR10-2015-0173273 20151207
- 主分类号: G11C16/04
- IPC分类号: G11C16/04 ; G11C16/14 ; G11C16/08 ; G11C16/26
摘要:
A nonvolatile memory device includes a memory cell array including a plurality of memory cells, a row decoder circuit connected to the memory cell array through a plurality of word lines; and a page buffer circuit connected to the memory cell array through bit lines. The row decoder circuit applies read voltages to a selected word line during a read operation. During a read operation performed with respect to each of N logical pages (N being a positive integer) of memory cells connected to the selected word line, the row decoder circuit applies a read voltage from among adjacent N read voltages to the selected word line without applying read voltages other than the adjacent N read voltages to the selected word line. The adjacent N read voltages include a second highest read voltage among the read voltages.
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