- 专利标题: Method of generating reference data for inspecting a circuit board
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申请号: US15021349申请日: 2014-09-11
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公开(公告)号: US09911185B2公开(公告)日: 2018-03-06
- 发明人: Seungwon Jung , Jongjin Choi , Heewook You
- 申请人: KOH YOUNG TECHNOLOGY INC.
- 申请人地址: KR Seoul
- 专利权人: KOH YOUNG TECHNOLOGY INC.
- 当前专利权人: KOH YOUNG TECHNOLOGY INC.
- 当前专利权人地址: KR Seoul
- 代理机构: Kile Park Reed & Houtteman PLLC
- 优先权: KR10-2013-0109909 20130912
- 国际申请: PCT/KR2014/008473 WO 20140911
- 国际公布: WO2015/037918 WO 20150319
- 主分类号: G06K9/00
- IPC分类号: G06K9/00 ; G06T7/00 ; G01N21/93 ; G01N21/956 ; G01B11/00
摘要:
The present invention relates to a method of generating reference data for inspecting a circuit board. The method comprises steps of scanning a bare circuit board to obtain image information of the bare circuit board, generating a compensation matrix using pad coordinate information extracted from the image information and pad coordinate information prestored in design data, and generating, by applying the compensation matrix to the image information, a reference data including coordinate information of a distinctive object. According to the method, inspection efficiency may optimized through quickly generating reference data without CAD information necessary for circuit board inspection.
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