Invention Grant
- Patent Title: Offset tunable edge slicer for sampling phase amplitude modulation signals
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Application No.: US15139779Application Date: 2016-04-27
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Publication No.: US09917713B2Publication Date: 2018-03-13
- Inventor: Kunzhi Yu , Cheng Li , Marco Fiorentino , Raymond G. Beausoleil
- Applicant: Hewlett Packard Enterprise Development LP
- Applicant Address: US TX Houston
- Assignee: Hewlett Packard Enterprise Development LP
- Current Assignee: Hewlett Packard Enterprise Development LP
- Current Assignee Address: US TX Houston
- Agency: Wall and Tong, LLP
- Main IPC: H03D1/00
- IPC: H03D1/00 ; H04L27/22 ; H04L27/233 ; H04L25/06

Abstract:
In one example, an apparatus includes an offset tunable edge slicer having an input to receive a pulse amplitude modulation signal. The offset tunable edge slicer also has a plurality of possible offset settings corresponding to a plurality of different reference voltages of the offset tunable edge slicer. A multiplexer has an output coupled to the input of the offset tunable edge slicer and an input to receive a control signal that selects one of the plurality of possible offset settings for the offset tunable edge slicer. A phase detector has an input coupled to an output of the offset tunable edge slicer.
Public/Granted literature
- US20170317865A1 OFFSET TUNABLE EDGE SLICER FOR SAMPLING PHASE AMPLITUDE MODULATION SIGNALS Public/Granted day:2017-11-02
Information query
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