- 专利标题： Method of measuring display delay time, display device, and method of manufacturing display
-
申请号： US15681631申请日： 2017-08-21
-
公开(公告)号： US09918078B2公开(公告)日： 2018-03-13
- 发明人: Ryuichi Shiohara , Tatsuya Ichikawa
- 申请人： SEIKO EPSON CORPORATION
- 申请人地址： JP Tokyo
- 专利权人： Seiko Epson Corporation
- 当前专利权人： Seiko Epson Corporation
- 当前专利权人地址： JP Tokyo
- 代理机构： Global IP Counselors, LLP
- 优先权： JP2012-226674 20121012; JP2012-226675 20121012; JP2012-226676 20121012
- 主分类号： H04N17/00
- IPC分类号： H04N17/00 ; H04N5/232
摘要：
A method of measuring a display delay time includes a step where a display pattern displayed on a first display including i (i is a natural number greater than 2) display elements is switched to a display pattern other than the display pattern at every elapse of a pattern continuation time, and j (j is a natural number, 1