Invention Grant
- Patent Title: Fitting sample points with an isovalue surface
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Application No.: US14684147Application Date: 2015-04-10
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Publication No.: US09928314B2Publication Date: 2018-03-27
- Inventor: David Leo Bonner
- Applicant: DASSAULT SYSTEMES
- Applicant Address: FR Velizy Villacoublay
- Assignee: DASSAULT SYSTEMES
- Current Assignee: DASSAULT SYSTEMES
- Current Assignee Address: FR Velizy Villacoublay
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: EP14305529 20140410
- Main IPC: G06F17/50
- IPC: G06F17/50 ; G06F17/10 ; G06T17/00 ; G06T15/08 ; G06F17/17

Abstract:
The invention notably relates to a computer-implemented method for designing a three-dimensional modeled object that represents a physical entity. The method comprises providing sample points; determining a volumetric function, within a predetermined class of volumetric functions, as the optimum of an optimization program that explores orientation vectors defined at the sample points, wherein the optimization program penalizes a distance from the explored orientation vectors; and fitting the sample points with an isovalue surface of the volumetric function, wherein the program further penalizes oscillations of the fitted isovalue surface.
Public/Granted literature
- US20150294036A1 FITTING SAMPLE POINTS WITH AN ISOVALUE SURFACE Public/Granted day:2015-10-15
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