Invention Grant
- Patent Title: Fault detection apparatus and method
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Application No.: US14899595Application Date: 2013-07-18
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Publication No.: US09952922B2Publication Date: 2018-04-24
- Inventor: Graham Edmiston , Alan Devine , David McMenamin , Andrew Roberston , James Andrew Collier Scobie
- Applicant: Graham Edmiston , Alan Devine , David McMenamin , Andrew Roberston , James Andrew Collier Scobie
- Applicant Address: US TX Austin
- Assignee: NXP USA, Inc.
- Current Assignee: NXP USA, Inc.
- Current Assignee Address: US TX Austin
- International Application: PCT/IB2013/055921 WO 20130718
- International Announcement: WO2015/008116 WO 20150122
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/07 ; G06F11/28

Abstract:
Apparatus suitable for detecting a fault in a processor comprises a monitor which receives input and output signals from the processor and generates a hash index key which is used to access entries in a hash table. The entries may include actions such as setting a timer so that the response of an output to a change of state of an input may be confirmed as valid within a specified time interval.
Public/Granted literature
- US20160239362A1 FAULT DETECTION APPARATUS AND METHOD Public/Granted day:2016-08-18
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