Invention Grant
- Patent Title: Capacitive micromachined ultrasonic transducer probe using wire-bonding
-
Application No.: US14728341Application Date: 2015-06-02
-
Publication No.: US09955948B2Publication Date: 2018-05-01
- Inventor: Sungchan Kang , Byunggil Jeong , Sangha Park , Hyungjae Shin
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: Sughrue Mion, PLLC
- Priority: KR10-2014-0086155 20140709
- Main IPC: A61B8/00
- IPC: A61B8/00 ; B06B1/02

Abstract:
Provided are capacitive micromachined ultrasonic transducer (CMUT) probes that use wire bonding. A CMUT probe includes a CMUT chip which includes a plurality of first electrode pads which are disposed on a first surface thereof, a printed circuit board (PCB) which is disposed on the first surface of the CMUT chip and which is configured to expose the plurality of first electrode pads, a plurality of second electrode pads which are disposed on the PCB and which correspond to respective ones of the plurality of first electrode pads, and a plurality of wires which connect each respective one of the plurality of first electrode pads to the corresponding one of the plurality of second electrode pads.
Public/Granted literature
- US20160007959A1 CAPACITIVE MICROMACHINED ULTRASONIC TRANSDUCER PROBE USING WIRE-BONDING Public/Granted day:2016-01-14
Information query