Invention Grant
- Patent Title: Control method of profile measuring apparatus
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Application No.: US15275985Application Date: 2016-09-26
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Publication No.: US09964392B2Publication Date: 2018-05-08
- Inventor: Takashi Noda , Hiromi Deguchi
- Applicant: MITUTOYO CORPORATION
- Applicant Address: JP Kanagawa
- Assignee: MITUTOYO CORPORATION
- Current Assignee: MITUTOYO CORPORATION
- Current Assignee Address: JP Kanagawa
- Agency: Greenblum & Bernstein, P.L.C.
- Priority: JP2015-207954 20151022
- Main IPC: G01B5/008
- IPC: G01B5/008 ; G01B5/012 ; G01B5/20 ; G01B21/04

Abstract:
During a retraction where a stylus tip separates from a work piece from a state where the stylus tip and the work piece are in contact, whether there is contact between the stylus tip and the work piece is monitored. When the contact between the stylus tip and the work piece is detected during the retraction, a probe is displaced to a position where the stylus tip does not come in contact with the work piece and a recovery process is executed. When a distance between a point on a surface of the work piece at a retraction start point and a contact point between the stylus tip and the work piece is Lm, and a value defined by (Lm−d) multiplied by a coefficient k (0
Public/Granted literature
- US20170115109A1 CONTROL METHOD OF PROFILE MEASURING APPARATUS Public/Granted day:2017-04-27
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