Invention Grant
- Patent Title: Nitride film forming method and storage medium
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Application No.: US15465789Application Date: 2017-03-22
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Publication No.: US09972486B2Publication Date: 2018-05-15
- Inventor: Hiroki Murakami , Takahiro Miyahara , Daisuke Suzuki
- Applicant: TOKYO ELECTRON LIMITED
- Applicant Address: JP Tokyo
- Assignee: TOKYO ELECTRON LIMITED
- Current Assignee: TOKYO ELECTRON LIMITED
- Current Assignee Address: JP Tokyo
- Agency: Nath, Goldberg & Meyer
- Agent Jerald L. Meyer
- Priority: JP2016-057910 20160323
- Main IPC: H01L21/02
- IPC: H01L21/02 ; C23C16/34 ; C23C16/455 ; C23C16/52

Abstract:
There is provided a method for forming a nitride film on a substrate to be processed by a thermal ALD which repeats: supplying a film forming raw material gas to the substrate to be processed while heating the substrate to be processed to a predetermined temperature; and supplying a nitriding gas to the substrate to be processed, the nitride film forming method comprises supplying a chlorine-containing gas to the substrate to be processed after the supplying the film forming raw material gas.
Public/Granted literature
- US20170278697A1 Nitride Film Forming Method and Storage Medium Public/Granted day:2017-09-28
Information query
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