- 专利标题: Semiconductor device and method of manufacturing the same
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申请号: US15664474申请日: 2017-07-31
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公开(公告)号: US09985039B2公开(公告)日: 2018-05-29
- 发明人: Satoshi Kodama , Eiji Hasegawa
- 申请人: Renesas Electronics Corporation
- 申请人地址: JP Tokyo
- 专利权人: RENESAS ELECTRONICS CORPORATION
- 当前专利权人: RENESAS ELECTRONICS CORPORATION
- 当前专利权人地址: JP Tokyo
- 代理机构: Shapiro, Gabor and Rosenberger, PLLC
- 优先权: JP2015-164789 20150824
- 主分类号: H01L27/115
- IPC分类号: H01L27/115 ; H01L27/11521 ; H01L29/423
摘要:
An insulating film made of the same material as that of a gate insulating film is formed so as to cover one sidewall of a control gate on a conducting film for floating gate. By selectively removing the conducting film for floating gate with the insulating film as a mask, a floating gate is formed from the conducting film for floating gate, and a portion of the gate insulating film is exposed at the floating gate. A nitrogen introduced portion is formed by introducing nitrogen into the exposed portion of the gate insulating film. Then, the insulating film is removed to expose an upper surface of a lateral protrusion of the floating gate. An erase gate is formed so as to face the upper surface and a side surface of the lateral protrusion.
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