Aspects disclosed in the detailed description include an electrostatic discharge (ESD) protection circuit. In this regard, in one aspect, an ESD protection circuit is provided to protect an integrated circuit (IC) during fabrication and production. An ESD detection circuitry detects an ESD event by detecting a voltage spike between a supply rail and a ground rail exceeding an ESD threshold voltage. In response to detecting the ESD event, an ESD clamping circuitry is activated to discharge the ESD event, thus protecting the IC from being damaged by the ESD event. By detecting the ESD event based on the ESD threshold voltage, as opposed to detecting the ESD event based on rise time of the voltage spike, it is possible to prevent the ESD clamping circuitry from missing voltage spikes associated with a slow rise time or being falsely activated by a normal power-on voltage associated with a fast rise time.