Abstract:
The described devices, systems and methods include an electro-static discharge clamp with a latch to prevent false triggering of an electro-static discharge protection circuit in response to fluctuations in a power supply rail.
Abstract:
Aspects disclosed in the detailed description include an electrostatic discharge (ESD) protection circuit. In this regard, in one aspect, an ESD protection circuit is provided to protect an integrated circuit (IC) during fabrication and production. An ESD detection circuitry detects an ESD event by detecting a voltage spike between a supply rail and a ground rail exceeding an ESD threshold voltage. In response to detecting the ESD event, an ESD clamping circuitry is activated to discharge the ESD event, thus protecting the IC from being damaged by the ESD event. By detecting the ESD event based on the ESD threshold voltage, as opposed to detecting the ESD event based on rise time of the voltage spike, it is possible to prevent the ESD clamping circuitry from missing voltage spikes associated with a slow rise time or being falsely activated by a normal power-on voltage associated with a fast rise time.
Abstract:
Aspects disclosed in the detailed description include an electrostatic discharge (ESD) protection circuit. In this regard, in one aspect, an ESD protection circuit is provided to protect an integrated circuit (IC) during fabrication and production. An ESD detection circuitry detects an ESD event by detecting a voltage spike between a supply rail and a ground rail exceeding an ESD threshold voltage. In response to detecting the ESD event, an ESD clamping circuitry is activated to discharge the ESD event, thus protecting the IC from being damaged by the ESD event. By detecting the ESD event based on the ESD threshold voltage, as opposed to detecting the ESD event based on rise time of the voltage spike, it is possible to prevent the ESD clamping circuitry from missing voltage spikes associated with a slow rise time or being falsely activated by a normal power-on voltage associated with a fast rise time.
Abstract:
The described devices, systems and methods include an electro-static discharge clamp with a latch to prevent false triggering of an electro-static discharge protection circuit in response to fluctuations in a power supply rail.
Abstract:
An electrostatic discharge (ESD) protection circuit is disclosed. In this regard, an ESD protection circuit is provided to protect an integrated circuit (IC) from an ESD event. In one aspect, an ESD voltage detection circuitry activates an ESD clamping circuitry when an ESD voltage associated with faster voltage rise time is detected between a supply rail and a ground rail. In another aspect, an operation voltage detection circuitry deactivates the ESD clamping circuitry when an operation voltage associated with slower voltage rise time is detected between the supply rail and the ground rail. By differentiating the ESD voltage from the operation voltage based on respective voltage rise times, it is possible to prevent the ESD clamping circuitry from missing the ESD voltage associated with the faster voltage rise time or being falsely activated by the operation voltage associated with the slower voltage rise time.
Abstract:
An electrostatic discharge (ESD) protection circuit is disclosed. In this regard, an ESD protection circuit is provided to protect an integrated circuit (IC) from an ESD event. In one aspect, an ESD voltage detection circuitry activates an ESD clamping circuitry when an ESD voltage associated with faster voltage rise time is detected between a supply rail and a ground rail. In another aspect, an operation voltage detection circuitry deactivates the ESD clamping circuitry when an operation voltage associated with slower voltage rise time is detected between the supply rail and the ground rail. By differentiating the ESD voltage from the operation voltage based on respective voltage rise times, it is possible to prevent the ESD clamping circuitry from missing the ESD voltage associated with the faster voltage rise time or being falsely activated by the operation voltage associated with the slower voltage rise time.
Abstract:
Self-biasing transistor switching circuitry includes a main transistor, a biasing transistor, a first capacitor, and a second capacitor. The body of the main transistor is isolated from the gate, the drain, and the source of the main transistor by an insulating layer. The first capacitor is coupled between the source and the gate of the main transistor. The second capacitor is coupled between the source and the body of the main transistor. The body and the drain of the main transistor are coupled together. The gate and the drain of the biasing transistor are coupled to the gate of the main transistor. The drain of the biasing transistor is coupled to the drain of the main transistor. The self-biasing transistor switching circuitry is adapted to receive an oscillating signal at the drain of the main transistor, and use the oscillating signal to appropriately bias the main transistor.
Abstract:
Self-biasing transistor switching circuitry includes a main transistor, a biasing transistor, a first capacitor, and a second capacitor. The body of the main transistor is isolated from the gate, the drain, and the source of the main transistor by an insulating layer. The first capacitor is coupled between the source and the gate of the main transistor. The second capacitor is coupled between the source and the body of the main transistor. The body and the drain of the main transistor are coupled together. The gate and the drain of the biasing transistor are coupled to the gate of the main transistor. The drain of the biasing transistor is coupled to the drain of the main transistor. The self-biasing transistor switching circuitry is adapted to receive an oscillating signal at the drain of the main transistor, and use the oscillating signal to appropriately bias the main transistor.
Abstract:
Aspects disclosed herein include trigger circuitry for electrostatic discharge (ESD) protection. In this regard, in one aspect, an ESD protection circuit is provided to protect an integrated circuit (IC) from an ESD event. Trigger circuitry, which includes a voltage divider for example, divides a voltage spike between a supply rail and a ground rail to provide a trigger voltage. An ESD clamping circuitry is activated to discharge the voltage spike when the trigger voltage is determined to exceed an ESD threshold voltage, thus protecting the IC from being damaged by the voltage spike. By activating the ESD clamping circuitry based on the trigger voltage divided from the voltage spike, it is possible to adapt the ESD protection circuit to provide ESD protection based on different ESD threshold voltages, thus making it possible to deploy the ESD protection circuit on ICs having different ESD protection requirements.
Abstract:
Self-biasing transistor switching circuitry includes a main transistor, a biasing transistor, a first capacitor, and a second capacitor. The body of the main transistor is isolated from the gate, the drain, and the source of the main transistor by an insulating layer. The first capacitor is coupled between the source and the gate of the main transistor. The second capacitor is coupled between the source and the body of the main transistor. The body and the drain of the main transistor are coupled together. The gate and the drain of the biasing transistor are coupled to the gate of the main transistor. The drain of the biasing transistor is coupled to the drain of the main transistor. The self-biasing transistor switching circuitry is adapted to receive an oscillating signal at the drain of the main transistor, and use the oscillating signal to appropriately bias the main transistor.