Invention Application
- Patent Title: METHOD FOR DETERMINING A POSITION OF A ROBOT
- Patent Title (中): 确定机器人位置的方法
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Application No.: PCT/US2002/020647Application Date: 2002-07-01
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Publication No.: WO2003007095A1Publication Date: 2003-01-23
- Inventor: FREEMAN, Marvin, L. , HUDGENS, Jeff , COX, Damon, Keith , PENCIS, Chris, Holt , RICE, Michael , VAN GOGH, David, A.
- Applicant: APPLIED MATERIALS, INC.
- Applicant Address: 3050 Bowers Avenue, Santa Clara, CA 95054 US
- Assignee: APPLIED MATERIALS, INC.
- Current Assignee: APPLIED MATERIALS, INC.
- Current Assignee Address: 3050 Bowers Avenue, Santa Clara, CA 95054 US
- Agency: PATTERSON, B., Todd
- Priority: US09/905,091 20010712
- Main IPC: G05B19/404
- IPC: G05B19/404
Abstract:
Generally, a method of determining a position of a robot is provided. In one embodiment, a method of determining a position of a robot comprises acquiring a first set of positional metrics, acquiring a second set of positional metrics and resolving the position of the robot due to thermal expansion using the first set and the second set of positional metrics. Acquiring the first and second set of positional metrics may occur at the same location within a processing system, or may occur at different locations. For example, in another embodiment, the method may comprise acquiring a first set of positional metrics at a first location proximate a processing chamber and acquiring a second set of positional metrics in another location. In another embodiment, substrate center information is corrected using the determined position of the robot.
Information query
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