The invention relates to a method for examining the precision of the shape of an object (1'), wherein the object (1') which is to be examined is compared to a reference element (2). Said method is characterised in that a scatter band (2) forming the reference element (2) is formed around the contour (1a, 1b) of a reference object (1), and the contour (1a, 1b) of the object (1) which is to be examined is compared to the scatter band. The invention also relates to a device for carrying out the above-mentioned method, comprising an image capture device (4) for detection of the contour (1a, 1b) of an object which is to be examined (1'). Said device is characterised in that a memory (5) is provided for storing a scatter band (2) surrounding the contour (1a, 1b), and a first comparison device (6) which examines the contour (1a, 1b) of the object (1') which is to be examined to see if it is located in the scatter band (2).